Could I help you?
View larger

ISO 23729:2022

M00012503

New product

ISO 23729:2022 Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

standard by International Organization for Standardization, 07/01/2022

More details

In stock

$116.00

More info

Full Description

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.