Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
TIA-1183
New product
TIA-1183 Revision A, March 28, 2017 Measurement Methods and Test Fixtures for Balun-less Measurements of Balanced Components and Systems
More info
Description / Abstract:
Balun-less measurement methods, nomenclature, and fixtures are defined for measurement of transmission parameters of four-pair (16 port) devices typically utilizing multi-port network analyzers. The methods and fixtures have been shown to facilitate measurement of all differential mode, mixed mode, and common mode transmission parameters. Test interface performance specifications up to 2 GHz are provided by this document.
Purpose
Removal of the balun transformers from the measurement circuit allows extension of the bandwidth of testing (both low and high frequencies) to the inherent capabilities of the network analyzer and associated test fixtures. Elimination of baluns also allows the DUT to be tested with both differential mode stimulus or response, or common mode stimulus or response. This enables testing of mixed mode parameters such as TCL, TCTL and cross-modal NEXT and FEXT couplings without reconfiguration of the DUT or the measurement setup. Additionally, the measurement data can be transformed into any required impedance environment, as explained in Annex C.
Purpose
Removal of the balun transformers from the measurement circuit allows extension of the bandwidth of testing (both low and high frequencies) to the inherent capabilities of the network analyzer and associated test fixtures. Elimination of baluns also allows the DUT to be tested with both differential mode stimulus or response, or common mode stimulus or response. This enables testing of mixed mode parameters such as TCL, TCTL and cross-modal NEXT and FEXT couplings without reconfiguration of the DUT or the measurement setup. Additionally, the measurement data can be transformed into any required impedance environment, as explained in Annex C.